Omniprobe电镜配件 Auto-Probe Accessories

1.Double TEM Grid Holder

The Double TEM Grid Holder holds two lift-out grids and has a spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner-type stage plates used in full wafer systems. Available with non-magnetic stainless steel or aluminum body. NM= non magnetic.

Prod #	Deｓｃｒｉｐｔion	Unit
460-306	Double TEM Grid Holder, NM-SS	each
460-307	Double TEM Grid Holder, Al	each

2.Double TEM Grid and Sample Holder

TEM grid and sample holder for FIB and SEM/FIB (DualBeam™ and CrossBeam®) systems with stations for 2 TEM lift-out grids and 2 sample mounts. This holder has a standard pin style post base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless steel or aluminum body.

Prod #	Deｓｃｒｉｐｔion	Unit
460-308	Double TEM Grid and Sample Holder, NM-SS	each
460-309	Double TEM Grid and Sample Holder, Al	each

3.Single Sample and Grid Holder

Single sample and TEM grid holder for FIB and SEM/FIB systems with stations for two TEM lift-out grids and one sample mount. This holder has a standard pin style post base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.

Available with non-magnetic stainless steel or aluminum body.

Prod #	Deｓｃｒｉｐｔion	Unit
460-312	Double TEM Grid and Single Sample Holder, NM-SS	each
460-313	Double TEM Grid and Single Sample Holder, Al	each

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Omniprobe电镜配件 Auto-Probe Accessories