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Omniprobe电镜配件 Auto-Probe Accessories

2010-10-15 10:05 上海桑戈生物科技有限 阅读 0
核心摘要: 1.Double TEM Grid Holder The Double TEM Grid Holder holds two lift-out grids and has a spring-loaded 关键词:Auto、Probe

 

1.Double TEM Grid Holder
The Double TEM Grid Holder holds two lift-out grids and has a spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner-type stage plates used in full wafer systems. Available with non-magnetic stainless steel or aluminum body. NM= non magnetic.
 

Prod #
Description
Unit
460-306
Double TEM Grid Holder, NM-SS
 each
460-307
Double TEM Grid Holder, Al
 each

 
2.Double TEM Grid and Sample Holder
TEM grid and sample holder for FIB and SEM/FIB (DualBeam™ and CrossBeam®) systems with stations for 2 TEM lift-out grids and 2 sample mounts. This holder has a standard pin style post base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless steel or aluminum body.

Prod #
Description
Unit
460-308
Double TEM Grid and Sample Holder, NM-SS
 each
460-309
Double TEM Grid and Sample Holder, Al
 each

 
3.Single Sample and Grid Holder
Single sample and TEM grid holder for FIB and SEM/FIB systems with stations for two TEM lift-out grids and one sample mount. This holder has a standard pin style post base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.
Available with non-magnetic stainless steel or aluminum body.
 

Prod #
Description
Unit
460-312
Double TEM Grid and Single Sample Holder, NM-SS
 each
460-313
Double TEM Grid and Single Sample Holder, Al
 each

 
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